Determination of the level of defective beans in coffee samples by using array of nanostructured sensors.

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dc.creatorPATERNO, L. G.
dc.creatorFONSECA, F. J.
dc.creatorDELIZA, R.
dc.creatorMATTOSO, L. H. C.
dc.date2013-08-12T23:31:16Z
dc.date2013-08-12T23:31:16Z
dc.date2008-11-26
dc.date2008
dc.date2013-08-12T23:31:16Z
dc.date.accessioned2026-07-07T04:22:26Z
dc.identifierIn: ENCONTRO DA SOCIEDADE BRASILEIRA DE PESQUISA EM MATERIAIS - SBPMat, 7., 2008, Guarujá; BRAZILIAN MRS MEETING, 7., 2008, Guarujá. Abstracts... Rio de Janeiro: SBPMat, 2008. não paginado. 1CD-ROM.
dc.identifierhttp://www.alice.cnptia.embrapa.br/alice/handle/doc/26898
dc.identifier.urihttp://hdl.handle.net/123456789/459545
dc.languageeng
dc.rightsopenAccess
dc.subjectEvento
dc.titleDetermination of the level of defective beans in coffee samples by using array of nanostructured sensors.
dc.typeResumo em anais e proceedings

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