Pathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot

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dc.creatorWagara, I
dc.creatorMwang’ombe, A.W.
dc.creatorKimenju, J.W.
dc.creatorBuruchara, Robin Arani
dc.creatorKimani, P.M.
dc.date2005
dc.date2015-05-04T09:17:57Z
dc.date2015-05-04T09:17:57Z
dc.date.accessioned2026-06-27T14:46:24Z
dc.identifierhttps://hdl.handle.net/10568/65526
dc.identifier.urihttp://hdl.handle.net/123456789/88064
dc.languageen
dc.publisherRockefeller Foundation
dc.rightsOpen Access
dc.sourceWagara, Isabel; Mwang`ombe, A.W.; Kimenju, J.W.; Buruchara, Robin A.; Kimani, Paul M. 2005. Pathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot . In: General Meeting of Biotechnology, Breeding & Seed Systems for African Crops (2, 2005, Nairobi, Kenya). Biotechnology, breeding and seed systems for African crops: Abstracts. Rockefeller Foundation, Nairobi, KE. 1 p.
dc.subjectphaseolus vulgaris
dc.subjectphaeoisariopsis griseola
dc.subjectpathogenicity
dc.subjectdisease resistance
dc.subjectpatogenicidad
dc.subjectresistencia a la enfermedad
dc.titlePathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot
dc.typeConference Paper

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