Atomic force microscopy as a tool applied to nano/biosensors.

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dc.contributorPAULO SERGIO DE P HERRMANN JUNIOR, CNPDIA.
dc.creatorSTEFFENS, C.
dc.creatorLEITE, F. L.
dc.creatorBUENO, C. C.
dc.creatorMANZOLI, A.
dc.creatorHERRMANN JUNIOR, P. S. de P.
dc.date2018-09-13T00:35:25Z
dc.date2018-09-13T00:35:25Z
dc.date2012-06-29
dc.date2012
dc.date2018-09-13T00:35:25Z
dc.date.accessioned2026-07-07T04:26:05Z
dc.identifierSensors, Basel, v. 12, p. 8278-8300, 2012.
dc.identifier1424-8220
dc.identifierhttp://www.alice.cnptia.embrapa.br/alice/handle/doc/927428
dc.identifier10.3390/s120608278
dc.identifier.urihttp://hdl.handle.net/123456789/461586
dc.languageeng
dc.rightsopenAccess
dc.subjectAtomic force spectroscopy
dc.subjectNanotecnology
dc.subjectNanosensors
dc.subjectAtomic force microscopy
dc.titleAtomic force microscopy as a tool applied to nano/biosensors.
dc.typeArtigo de periódico

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