Fuentes externas
URI permanente para esta comunidadhttp://hdl.handle.net/123456789/2
Examinar
8 resultados
community.search.results.head
Ítem Standard Operating Procedure (SOP) for phenotyping for BBTV resistance and PCR confirmation(International Institute of Tropical Agriculture) Nakato, G.V.; Bashizi, B.; Casinga, C.; Hendrastuti, E.S.; Sudarmonowati, E.; Swennen, R.; Uwimana, B.Ítem Standard Operating Procedure (SOP) for banana bacterial wilt resistance screening(International Institute of Tropical Agriculture) Kanaabi, R.; Mwanje, G.; Kinalwa, N.; Kisitu, J.; Mulongo, M.; Nakato, G.V.Ítem Standard Operating Procedure (SOP) for digital imaging and quantification of banana weevil damage using Ilastik and ImageJ (Fiji)(International Institute of Tropical Agriculture) Mwanje, G.; Shah, T.; Swennen, R.; Nakato, G.V.Ítem Standard Operating Procedure (SOP) for screening banana resistance against Fusarium wilt (Foc Race 1)(International Institute of Tropical Agriculture) Jomanga, K.; Kanaabi, R.; Mwanje, G.; Kinalwa, N.; Nakato, G.V.Ítem Standard Operating Procedure (SOP) for In vitro high throughput (HTP) phenotyping of banana for nematode resistance(International Institute of Tropical Agriculture) Kanaabi, R.; Kisitu, J.; Serebe, C.; Kinalwa, N.; Coyne, D.; Nakato, G.V.Ítem Standard Operating Procedure (SOP) for screening for banana resistance to weevils(International Institute of Tropical Agriculture) Mwanje, G.; Kanaabi, R.; Serebe, C.; Kinalwa, N.; Kisitu, J.; Kolombia, Y.A.; Nakato, G.V.Ítem Standard Operating Procedure (SOP) for phenotyping banana for resistance to the root burrowing nematode (Radopholus similis)(International Institute of Tropical Agriculture) Kisitu, J.; Kanan, S.; Kisaakye, J.; Kolombia, Y.A.; Nakato, G.V.; Kinalwa, N.; Mpanda, H.; Kanaabi, R.; Sikora, R.; Coyne, D.L.Ítem Standard Operating Procedure (SOP) for screening for resistance to Black Sigatoka (P. fijiensis) in bananas(International Institute of Tropical Agriculture) Kinalwa, N.; Serebe, C.; Mwanje, G.; Kanaabi, R.; Kisitu, J.; Mulongo, M.; Nakato, G.V.
